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Beckman Coulter LS 13 320 XR Single Wavelength (SW) Laser Diffraction Particle Size Analyzer Optical Bench
The LS 13 320 XR Laser Diffraction Particle Size Analyzer Single Wavelength (SW) Optical Bench features low-angle, forward light scattering optics. Optical Bench requires a sampling module and offers a measurement range of 0.40 μm to 2,000 μm or 3,500 μm, depending on the selected module.
Supplier: Beckman Coulter B98100
Description
- Offers particle size distribution data from advanced Polarization Intensity Differential Scattering (PIDS) technology, which enables high-resolution measurements and an expanded dynamic range
- The XR particle size analyzer provides fast, accurate results, and helps streamline workflows for optimal efficiency
- Enhanced software simplifies method creation for standardized measurements
- Provides accurate, reliable detection of multiple particle sizes in a single sample
- New control standards adequately verify instrument/module performance
- ADAPT Software features pass/fail results for faster quality control
- High-security software configuration supports 21 CFR Part 11
- Direct measurement range from 0.40 μm to 2,000 μm or 3,500 μm (Depending on the chosen sampling module)
- Requires a sampling module, and the LS 13 320 XR Workstation or customer-supplied Windows 10 PC that meets Beckman minimum specifications
Specifications
| LS 13 320 XR SW optical bench | |
| 0.40 μm to 3,500 μm | |
| LS 13 320 XR Single Wavelength (SW) Laser Diffraction Particle Size Analyzer |