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Beckman Coulter LS 13 320 XR Single Wavelength (SW) Laser Diffraction Particle Size Analyzer
Single Wavelength (SW) Laser Diffraction Particle Size Analyzer provides expanded measurement range from 0.40 μm to 3,500 μm. The DPS is capable of measuring dry powder samples, while the ULM analyzes samples suspended in aqueous or non-aqueous dilutents.
Supplier: Beckman Coulter C53022
Description
- Offers particle size distribution data from advanced Polarization Intensity Differential Scattering (PIDS) technology, which enables high-resolution measurements and an expanded dynamic range
- The XR particle size analyzer provides fast, accurate results, and helps streamline workflows for optimal efficiency
- Dry Powder System (DPS) Module delivers reliable results from 0.40 μm to 3,500 μm for all types of homogeneous and heterogeneous samples that can be dispersed dry
- Universal Liquid Module (ULM) analyzes samples suspended in aqueous or non-aqueous dilutents ranging in size from 0.010 μm to 2000 μm
- Enhanced software simplifies method creation for standardized measurements
- Provides accurate, reliable detection of multiple particle sizes in a single sample
- New control standards adequately verify instrument/module performance
- ADAPT Software features pass/fail results for faster quality control
- High-security software configuration supports 21 CFR Part 11
- Direct measurement range from 0.40 μm to 3,500 μm
- Requires the LS 13 320 XR Workstation or customer-supplied Windows 10 PC that meets Beckman minimum specifications
Specifications
| LS13 320 XR SW Analyzer/DPS | |
| 0.40 μm to 3,500 μm | |
| Requires Controller, and Standard LS/HiCap Vacuum |
| LS 13 320 XR SW | |
| Particle Size Analysis of Dry Powder, Aqueous, and Non-Aqueous Samples | |
| Dry Powder System (DPS) |