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Beckman Coulter LS 13 320 XR Multiwavelength (MW) Laser Diffraction Particle Size Analyzer Optical Bench
The LS 13 320 XR Laser Diffraction Particle Size Analyzer Multi-Wavelength (MW) Optical Bench features low-angle, forward light scattering with additional PIDS Technology. Optical Bench offers a measurement range of 0.010 μm to 3,500 μm and requires a Sampling Module, either ULM or DPS.
Supplier: Beckman Coulter B98101
Description
- Offers particle size distribution data from advanced Polarization Intensity Differential Scattering (PIDS) technology, which enables high-resolution measurements and an expanded dynamic range
- 3 light wavelengths (450, 600, & 900 nm) irradiate samples with vertical & horizontal polarized light
- The XR particle size analyzer provides fast, accurate results, and helps streamline workflows for optimal efficiency
- Enhanced software simplifies method creation for standardized measurements
- Provides accurate, reliable detection of multiple particle sizes in a single sample
- New control standards adequately verify instrument/module performance
- ADAPT Software features pass/fail results for faster quality control
- High-security software configuration supports 21 CFR Part 11
- Direct measurement range from 0.010 μm to 3,500 μm
- Requires the a Sampling Module, as well as a LS 13 320 XR Workstation or customer-supplied Windows 10 PC that meets Beckman minimum specifications
Specifications
| LS 13 320 XR MW optical bench | |
| 0.010 μm to 3,500 μm | |
| LS 13 320 XR Laser Diffraction Particle Size Analyzer Multi-Wavelength (MW) | |
| PIDS Technology |